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A new method to measure general birefringence in crystals

Verreault René. (1972). A new method to measure general birefringence in crystals. Zeitschrift für Kristallographie, 136, (5-6), p. 350-386.

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URL officielle: https://dx.doi.org/doi:10.1524/zkri.1972.136.5-6.3...

Résumé

The scattering properties of an anisotropic solid for polarized light allow the observation and the measurement of linear, circular and elliptic birefringence. A general analysis of the phenomenon for any kind of birefringence and any state of polarization of the incident light vibration is given. Scattering by particles with size a [formula omitted] λ (Rayleigh limit) or a ≈ λ is considered. It follows from the theory that the scattering-center distribution is equivalent to a quasi-continuous array of analyzers providing a simultaneous analyzation of the transmitted beam along its whole path in the (in general elliptically) biréfringent medium. A new technique based on surface scattering is described. It allows visual observations to be made on very perfect (hence weakly scattering) crystals with low-power light sources and without being forced to achieve complete darkness in the surroundings of the sample. The method of surface scattering is especially adequate for precision measurements; it is thoroughly tested with the elliptic birefringence of quartz. Both methods of surface and bulk scattering are applied to various kinds of birefringence in single crystals of Eu2SiO4 and EuTe.

Type de document:Article publié dans une revue avec comité d'évaluation
ISSN:0044-2968
Volume:136
Numéro:5-6
Pages:p. 350-386
Version évaluée par les pairs:Oui
Date:1972
Identifiant unique:10.1524/zkri.1972.136.5-6.350
Sujets:Sciences naturelles et génie > Sciences naturelles > Physique
Département, module, service et unité de recherche:Départements et modules > Département des sciences fondamentales
Mots-clés:birefringence, crystal, EuTe, Europium telluride, surface scattering, Eu2SiO4
Informations complémentaires:The final publication is available at https://dx.doi.org/doi:10.1524/zkri.1972.136.5-6.350
Déposé le:15 mai 2020 13:03
Dernière modification:15 mai 2020 13:03
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