Verreault René. (1972). A new method to measure general birefringence in crystals. Zeitschrift für Kristallographie, 136, (5-6), p. 350-386.
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URL officielle: https://dx.doi.org/doi:10.1524/zkri.1972.136.5-6.3...
Résumé
The scattering properties of an anisotropic solid for polarized light allow the observation and the measurement of linear, circular and elliptic birefringence. A general analysis of the phenomenon for any kind of birefringence and any state of polarization of the incident light vibration is given. Scattering by particles with size a [formula omitted] λ (Rayleigh limit) or a ≈ λ is considered. It follows from the theory that the scattering-center distribution is equivalent to a quasi-continuous array of analyzers providing a simultaneous analyzation of the transmitted beam along its whole path in the (in general elliptically) biréfringent medium. A new technique based on surface scattering is described. It allows visual observations to be made on very perfect (hence weakly scattering) crystals with low-power light sources and without being forced to achieve complete darkness in the surroundings of the sample. The method of surface scattering is especially adequate for precision measurements; it is thoroughly tested with the elliptic birefringence of quartz. Both methods of surface and bulk scattering are applied to various kinds of birefringence in single crystals of Eu2SiO4 and EuTe.
| Type de document: | Article publié dans une revue avec comité d'évaluation |
|---|---|
| ISSN: | 0044-2968 |
| Volume: | 136 |
| Numéro: | 5-6 |
| Pages: | p. 350-386 |
| Version évaluée par les pairs: | Oui |
| Date: | 1972 |
| Identifiant unique: | 10.1524/zkri.1972.136.5-6.350 |
| Sujets: | Sciences naturelles et génie > Sciences naturelles > Physique |
| Département, module, service et unité de recherche: | Départements et modules > Département des sciences fondamentales |
| Mots-clés: | birefringence, crystal, EuTe, Europium telluride, surface scattering, Eu2SiO4 |
| Informations complémentaires: | The final publication is available at https://dx.doi.org/doi:10.1524/zkri.1972.136.5-6.350 |
| Déposé le: | 15 mai 2020 13:03 |
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| Dernière modification: | 15 mai 2020 13:03 |
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