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Review of different techniques to study the interactions between coke and pitch in anode manufacturing

Kocaefe Duygu, Sarkar Arunima, Das Shipan, Amrani Salah, Bhattacharyay Dipankar, Sarkar Dilip K., Kocaefe Yasar S., Morais Brigitte et Gagnon Marc. (2013). Review of different techniques to study the interactions between coke and pitch in anode manufacturing. Dans Light Metals 2013. (p. 1045-1050). The Minerals, Meatls & Materials Series. Switzerland AG : Springer, Cham.

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URL officielle: https://dx.doi.org/doi:10.1007/978-3-319-65136-1_1...

Résumé

The quality of carbon anodes, consumed in electrolysis during the primary aluminum production, has an important impact on the electrolytic cell performance. Coke and pitch are the raw materials used in anode manufacturing. The raw material properties and the process parameters during production determine the anode quality. A plant receives these materials from different sources, and the variability in their properties is usually a major concern during anode production. The interaction between coke and pitch influences strongly the anode properties. Study of coke and pitch individually as well as the interactions between them using different techniques (spectroscopic, optical, etc.) such as XRD, FTIR, XPS, and SEM help identify their compatibility. Each technique gives information on different aspects of the raw materials. In this article, the use of a number of these techniques for studying coke, pitch, and their interactions will be discussed. Results will be presented for a number of cases.

Type de document:Chapitre de livre
Date:2013
Lieu de publication:Switzerland AG
Sujets:Sciences naturelles et génie > Génie
Sciences naturelles et génie > Génie > Génie des matériaux et génie métallurgique
Sciences naturelles et génie > Sciences appliquées
Département, module, service et unité de recherche:Départements et modules > Département des sciences appliquées > Module d'ingénierie
Éditeurs:Sadler, Barry A.
Mots-clés:Coke, pitch, image analysis, optical microscopy, SEM, XRD, XPS, analyse d'image, microscopie optique, proceedings
Déposé le:09 août 2021 14:31
Dernière modification:09 août 2021 14:31
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